A technique for the rapid measurement of thickness during the preparation of disk specimens for transmission electron microscopy
J V Sharp; J V Sharp; Metallurgy Division, Atomic Energy Research Establishment, Harwell, Didcot, Berks
Журнал:
Journal of Scientific Instruments
Дата:
1967-04-01
Аннотация:
A technique utilizing β particle absorption is described for the rapid measurement of thickness during preparation of disk specimens for transmission electron microscopy.
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