Electron-beam-induced voltage contrast (EBIV) and modulated optical reflectivity (MOR) have been used to study the electrical properties of superconducting microwave resonators. The three resonators studied were patterned (YBCO) films on MgO substrates. The YBCO films consisted of a wide central track of 8 mm length separated from the ground plane by . A qualitative correlation was observed between the EBIV and MOR signals observed throughout the central track of the resonator. The EBIV results were taken close to the superconducting transition while the MOR data were obtained at room temperature. Both techniques are dependent on the local electrical properties which in turn are governed to a large extent by the local oxygen content within the superconductor. The correlation between the MOR technique and the more established EBIV technique has shown MOR to be a useful inspection tool for superconducting devices, particularly as MOR is a contactless room-temperature technique.