Автор | J C Booth |
Автор | L R Vale |
Автор | R H Ono |
Автор | J H Claassen |
Дата выпуска | 1999-11-01 |
dc.description | We demonstrate the use of a new experimental technique based on mutual inductance measurements to quantitatively predict nonlinear effects in microwave devices fabricated from high-temperature superconductor (HTS) materials. The mutual inductance measurements yield the current dependence of the penetration depth (J) in unpatterned HTS thin films. This information is used to calculate third-harmonic generation in coplanar waveguide (CPW) transmission lines and compares very well with actual measurements of CPW transmission lines of variable dimensions fabricated from YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-</sub> thin film samples. The mutual inductance measurements should prove extremely valuable as a screening technique for microwave applications of HTS materials that require very low nonlinear response. |
Формат | application.pdf |
Издатель | Institute of Physics Publishing |
Название | Predicting nonlinear effects in superconducting microwave transmission lines from mutual inductance measurements |
Тип | paper |
DOI | 10.1088/0953-2048/12/11/306 |
Electronic ISSN | 1361-6668 |
Print ISSN | 0953-2048 |
Журнал | Superconductor Science and Technology |
Том | 12 |
Первая страница | 711 |
Последняя страница | 713 |
Выпуск | 11 |