Автор |
N A Rutter |
Автор |
B A Glowacki |
Автор |
J E Evetts |
Дата выпуска |
2000-11-01 |
dc.description |
Surface and bulk texture measurements have been carried out on highly aligned NiFe tapes, suitable for use as coated conductor substrates. Data from small-area electron backscatter diffraction measurements are compared with those from bulk x-ray analysis in the development of a two-dimensional percolation model, and the two are shown to give very similar results. No evidence of grain-to-grain correlation is found. The model is then developed to assess how the properties of a superconducting layer grown epitaxially on buffered tapes will depend on parameters such as sample size, grain size and the extent of grain alignment. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Percolation modelling for highly aligned polycrystalline superconducting tapes |
Тип |
lett |
DOI |
10.1088/0953-2048/13/11/101 |
Electronic ISSN |
1361-6668 |
Print ISSN |
0953-2048 |
Журнал |
Superconductor Science and Technology |
Том |
13 |
Первая страница |
L25 |
Последняя страница |
L30 |
Аффилиация |
N A Rutter; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE, UK |
Аффилиация |
B A Glowacki; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE, UK |
Аффилиация |
J E Evetts; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE, UK |
Выпуск |
11 |