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Автор N A Rutter
Автор B A Glowacki
Автор J E Evetts
Дата выпуска 2000-11-01
dc.description Surface and bulk texture measurements have been carried out on highly aligned NiFe tapes, suitable for use as coated conductor substrates. Data from small-area electron backscatter diffraction measurements are compared with those from bulk x-ray analysis in the development of a two-dimensional percolation model, and the two are shown to give very similar results. No evidence of grain-to-grain correlation is found. The model is then developed to assess how the properties of a superconducting layer grown epitaxially on buffered tapes will depend on parameters such as sample size, grain size and the extent of grain alignment.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Percolation modelling for highly aligned polycrystalline superconducting tapes
Тип lett
DOI 10.1088/0953-2048/13/11/101
Electronic ISSN 1361-6668
Print ISSN 0953-2048
Журнал Superconductor Science and Technology
Том 13
Первая страница L25
Последняя страница L30
Аффилиация N A Rutter; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE, UK
Аффилиация B A Glowacki; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE, UK
Аффилиация J E Evetts; Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge CB2 3QZ, UK and IRC in Superconductivity, Madingley Road, Cambridge CB3 0HE, UK
Выпуск 11

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