A simple high-temperature superconducting thin-film optical bolometer
B Dwir; L Pavesi; J H James; B Kellett; D Pavuna; F K Reinhart; B Dwir; Inst. of Micro- & Opto-electron., Swiss Federal Inst. of Technol., Lausanne, Switzerland; L Pavesi; Inst. of Micro- & Opto-electron., Swiss Federal Inst. of Technol., Lausanne, Switzerland; J H James; Inst. of Micro- & Opto-electron., Swiss Federal Inst. of Technol., Lausanne, Switzerland; B Kellett; Inst. of Micro- & Opto-electron., Swiss Federal Inst. of Technol., Lausanne, Switzerland; D Pavuna; Inst. of Micro- & Opto-electron., Swiss Federal Inst. of Technol., Lausanne, Switzerland; F K Reinhart; Inst. of Micro- & Opto-electron., Swiss Federal Inst. of Technol., Lausanne, Switzerland
Журнал:
Superconductor Science and Technology
Дата:
1989-12-01
Аннотация:
The authors have demonstrated the operation of a simple optical bolometer by irradiating a constriction in a Y<sub>1</sub>Ba<sub>2</sub>Cu<sub>3</sub>O<sub>7- delta </sub> thin film with chopped laser light at lambda =633 nm. The change in film resistivity was measured by lock-in detection of the AC component in the current-biased mode. Operating optimally near 77 K, the bolometer shows detectivity of 5 mV W<sup>-1</sup> and NEP of 10<sup>-6</sup> W Hz<sup>-1</sup>2/. The authors discuss the possibility of methods to improve these figures by at least three orders of magnitude.
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