Characteristics of epitaxial Y-Ba-Cu-O thin films grown by aerosol MOCVD technique
I V Khoroshun; E V Karyaev; V T Moshnyaga; G A Kiosse; M A Krachun; V M Zakosarenko; V Yu Davydov; I V Khoroshun; Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldovan SSR, USSR; E V Karyaev; Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldovan SSR, USSR; V T Moshnyaga; Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldovan SSR, USSR; G A Kiosse; Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldovan SSR, USSR; M A Krachun; Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldovan SSR, USSR; V M Zakosarenko; Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldovan SSR, USSR; V Yu Davydov; Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldovan SSR, USSR
Журнал:
Superconductor Science and Technology
Дата:
1990-10-01
Аннотация:
YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7-x</sub>/MgO(100) epitaxial films (T<sub>c</sub><sup>off</sup> approximately=80 K and J<sub>c</sub> approximately=10<sup>7</sup> A cm<sup>-2</sup> at T=4.2 K, B=5 T) were prepared using an unconventional MOCVD technique. The method is based on the use of a solution of Y-, Ba- and Cu- beta -diketonates, carried to the reaction zone in aerosol form. In the paper the essentials of aerosol MOCVD technique and the results of film characterization by X-ray diffraction analysis, scanning electron microscopy, Raman spectroscopy and critical current measurements are represented.
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