The influence of growth temperature on the structural characteristics of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7- delta </sub> films: a Raman scattering study
M V Belousov; V Yu Davydov; A B Sherman; M V Belousov; AF Ioffe Phys. Tech. Inst., St Petersburg, Russia; V Yu Davydov; AF Ioffe Phys. Tech. Inst., St Petersburg, Russia; A B Sherman; AF Ioffe Phys. Tech. Inst., St Petersburg, Russia
Журнал:
Superconductor Science and Technology
Дата:
1993-12-01
Аннотация:
Orientation of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7- delta </sub> films at the surface and at the film-(100) MgO substrate interface for various growth temperatures T<sub>s</sub> have been studied using Raman scattering. On the film-substrate interface the films were c-oriented for T<sub>s</sub>>670 degrees C and a-oriented for lower growth temperatures. Films grown at T<sub>s</sub> approximately=670 degrees C to a thickness >0.2 mu m contained a transition from the c- to the a-orientation near the surface. A possible mechanism for the influence of growth temperature on the YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7- delta </sub> film orientation is discussed.
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