| Автор | S I Shkuratov |
| Автор | S N Shillimanov |
| Автор | S N Ivanov |
| Дата выпуска | 1993-07-01 |
| dc.description | A technique has been developed for the preparation of high-temperature oxide superconducting (HTSC) single-crystal sharp-pointed specimens for field emission microscopy and spectroscopy. The technique provides low-resistance and low-noise contact between the HTSC and the metallic substrate. The ion image of an HTSC specimen is formed at a voltage of U approximately=2-4 kV. Investigations carried out allow one to draw the conclusion that the physical properties of HTSC point specimens prepared by the proposed technique and those of specimens prepared by the method of mechanical splitting are identical. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Preparation of high-T<sub>c </sub>superconducting single-crystal sharp-pointed specimens for field electron emission microscopy and spectroscopy |
| Тип | paper |
| DOI | 10.1088/0953-2048/6/7/012 |
| Electronic ISSN | 1361-6668 |
| Print ISSN | 0953-2048 |
| Журнал | Superconductor Science and Technology |
| Том | 6 |
| Первая страница | 520 |
| Последняя страница | 524 |
| Аффилиация | S I Shkuratov; Inst. of Electrophy., Acad. of Sci., Ekaterinburg, Russia |
| Аффилиация | S N Shillimanov; Inst. of Electrophy., Acad. of Sci., Ekaterinburg, Russia |
| Аффилиация | S N Ivanov; Inst. of Electrophy., Acad. of Sci., Ekaterinburg, Russia |
| Выпуск | 7 |
