Thermo-electric oscillations in HTSC film structures: estimation of thermal parameters
A L Korotkov; A N Reznik; A A Zharov; A L Korotkov; Institute for Physics of Microstructures, Russian Academy of Sciences, 46 Ulyanov Street, 603600 Nizhny Novgorod, Russia; A N Reznik; Institute for Physics of Microstructures, Russian Academy of Sciences, 46 Ulyanov Street, 603600 Nizhny Novgorod, Russia; A A Zharov; Institute for Physics of Microstructures, Russian Academy of Sciences, 46 Ulyanov Street, 603600 Nizhny Novgorod, Russia
Журнал:
Superconductor Science and Technology
Дата:
1996-05-01
Аннотация:
The conditions and parameters of thermo-electric oscillations in short HTSC film bridges on dielectric substrates have been investigated theoretically and experimentally. A new method for determination of thermal parameters of the structure is proposed. Such a method can be used for the diagnostics of HTSC microbolometers.
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