An X-ray diffraction study on Cu-Ti metallic multilayers
W Liu; A Hu; S S Jiang; Y Qiu; W -H Liu; Z Q Wu; W Liu; Fundamental Phys. Centre, Univ. of Sci. & Technol. of China, Hefei, China; A Hu; Fundamental Phys. Centre, Univ. of Sci. & Technol. of China, Hefei, China; S S Jiang; Fundamental Phys. Centre, Univ. of Sci. & Technol. of China, Hefei, China; Y Qiu; Fundamental Phys. Centre, Univ. of Sci. & Technol. of China, Hefei, China; W -H Liu; Fundamental Phys. Centre, Univ. of Sci. & Technol. of China, Hefei, China; Z Q Wu; Fundamental Phys. Centre, Univ. of Sci. & Technol. of China, Hefei, China
Журнал:
Journal of Physics: Condensed Matter
Дата:
1989-11-13
Аннотация:
An X-ray diffraction and computer-simulation study of Cu-Ti metallic multilayers is presented. The results show Cu-Ti artificial metallic multilayers made by magnetron sputtering technique are metallic superlattices with high structure order. An obvious even extinction phenomenon on the X-ray patterns was found and used in the analyses. Taking into account the structural coherence length perpendicular to the layers and the layer-thickness fluctuation in every period, the calculated X-ray diffraction curves are in good agreement with those measured.
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