| Автор | G R Brandes |
| Автор | K F Canter |
| Автор | T N Horsky |
| Автор | P H Lippel |
| Автор | A P Mills Jr |
| Дата выпуска | 1989-07-01 |
| dc.description | The production of a positron microbeam using the high-brightness beam developed at Brandeis University and possible applications of this microbeam to spatially resolved defect studies and positron microscopy are reviewed. The high-brightness beam consists of a W(110) primary moderator and two remoderation stages which provide a 500-fold increase in brightness. With this brightness increase and microbeam optics, the authors are able to form a 12 mu m FWHM beam (48 mrad pencil half-angle) at 5 keV beam energy. The well characterised small-diameter beam is particularly adaptable for determining defect concentration and structure, both laterally and in a depth-profiling mode. In the case of a transmission positron microscope or a positron reemission microscope operating in a high-magnification mode, efficient image formation requires the use of a microbeam to maximise the number of positrons in the area being imaged. Results of the scanning microbeam tests and the application of a microbeam to positron microscopy and defect studies are reviewed. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Production and applications of positron microbeams |
| Тип | paper |
| DOI | 10.1088/0953-8984/1/SA/019 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 1 |
| Первая страница | SA135 |
| Последняя страница | SA143 |
| Аффилиация | G R Brandes; Brandeis Univ., Waltham, MA, USA |
| Аффилиация | K F Canter; Brandeis Univ., Waltham, MA, USA |
| Аффилиация | T N Horsky; Brandeis Univ., Waltham, MA, USA |
| Аффилиация | P H Lippel; Brandeis Univ., Waltham, MA, USA |
| Аффилиация | A P Mills Jr; Brandeis Univ., Waltham, MA, USA |
| Выпуск | SA |
