| Автор | K K Sharma |
| Автор | P N Kotru |
| Автор | R P Tandon |
| Автор | B M Wanklyn |
| Дата выпуска | 1998-06-22 |
| dc.description | Results of microhardness measurements and dielectric studies carried out on flux-grown single crystals are presented. Load independent values of hardness are estimated for (110) and (001) planes by applying the law of Hays and Kendall. The values of fracture toughness and brittleness index are calculated for median cracks at higher loads. Hardness anisotropy for both the crystal planes considered is reported. The dielectric constant, dielectric loss and conductivity are found to be dependent on temperature as well as frequency of the applied a.c. field. The anomalous behaviour of dielectric constant against temperature suggests some transition taking place at . |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Indentation-induced microhardness and dielectric studies of flux-grown gadolinium aluminate crystals |
| Тип | paper |
| DOI | 10.1088/0953-8984/10/24/006 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 10 |
| Первая страница | 5277 |
| Последняя страница | 5287 |
| Выпуск | 24 |
