| Автор | Nguyen Van Lien |
| Автор | Ralph Rosenbaum |
| Дата выпуска | 1998-07-13 |
| dc.description | We observe a crossover in the temperature dependence of the variable-range-hopping resistivity in a three-dimensional nickel-silicon film from the Mott -behaviour to the soft-gap -behaviour with . We propose general expressions for describing such crossovers from -behaviour to -behaviour for any from 1/4 to 1. The theoretical expressions fit the experimental data well. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | General resistance crossover expressions for three-dimensional variable-range hopping |
| Тип | paper |
| DOI | 10.1088/0953-8984/10/27/009 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 10 |
| Первая страница | 6083 |
| Последняя страница | 6090 |
| Выпуск | 27 |
