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Автор V V Afonin
Автор V L Gurevich
Автор R Laiho
Автор A Pavlov
Автор Y Pavlova
Дата выпуска 1998-10-05
dc.description A new phenomenon of periodic oscillations is observed in I-V characteristics of porous silicon under illumination by visible light. The measurements are performed at room temperature using a scanning tunnelling microscope. The heights of the oscillation peaks appear to be a linear function of the oscillation number. The experimental value of the Coulomb energy determined from the oscillation period is much smaller than . The oscillations are attributed to a Coulomb effect, i.e. to the periodic trapping of a multi-electron level in a quantum well within a Si nanocrystal under the combined influence of the Coulomb interaction among the carriers and the variation of the potential difference between the STM tip and the semiconductor surface.
Формат application.pdf
Издатель Institute of Physics Publishing
Название A novel room temperature oscillatory phenomenon in photoinduced scanning tunnelling microscope spectra of porous Si
Тип paper
DOI 10.1088/0953-8984/10/39/008
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 10
Первая страница 8687
Последняя страница 8702
Выпуск 39

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