Автор |
S Mukhopadhyay |
Автор |
T K Ballabh |
Дата выпуска |
1999-05-03 |
dc.description |
In this work we have proposed an iterative method for direct determination of relaxation parameters from low-energy electron diffraction (LEED) intensity patterns. The algorithm is based on the layer-doubling method. It is shown that, with some realistic constraints, the relaxation parameter for a single relaxed structure can be obtained, and this solution can be utilized to determine the two-layer relaxed structure iteratively. With simulated intensity patterns for a one-dimensional model, the method is found to work well. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
An iterative method for retrieval of structural parameters of surfaces with two relaxed overlayers |
Тип |
paper |
DOI |
10.1088/0953-8984/11/17/303 |
Electronic ISSN |
1361-648X |
Print ISSN |
0953-8984 |
Журнал |
Journal of Physics: Condensed Matter |
Том |
11 |
Первая страница |
3443 |
Последняя страница |
3448 |
Аффилиация |
S Mukhopadhyay; Condensed Matter Physics Research Centre, Department of Physics, Jadavpur University, Calcutta-700 032, India |
Аффилиация |
T K Ballabh; Condensed Matter Physics Research Centre, Department of Physics, Jadavpur University, Calcutta-700 032, India |
Выпуск |
17 |