| Автор | K K Tiong |
| Автор | T S Shou |
| Дата выпуска | 2000-06-12 |
| dc.description | Anisotropy of rhenium-doped MoS<sub>2</sub> parallel and perpendicular to the c-axis (k∥c and k⊥c) was studied using electrolyte electroreflectance (EER) measurements over an energy range from 1.75 eV to 4.5 eV. The measurements for k⊥c were made possible by the thicker samples of MoS<sub>2</sub> available through introducing a small concentration of rhenium during growth. The excitonic transitions A and B for both k⊥c and k∥c configurations showed different degrees of red shift compared with that of the undoped sample. It is found that rhenium which is present as an intentionally doped impurity plays an important role in affecting the observed differences. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Anisotropic electrolyte electroreflectance study of rhenium-doped MoS<sub>2</sub> |
| Тип | paper |
| DOI | 10.1088/0953-8984/12/23/312 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 12 |
| Первая страница | 5043 |
| Последняя страница | 5052 |
| Аффилиация | K K Tiong; Department of Electrical Engineering, National Taiwan Ocean University, Keelung 202, Taiwan, Republic of China |
| Аффилиация | T S Shou; Department of Electrical Engineering, National Taiwan Ocean University, Keelung 202, Taiwan, Republic of China |
| Выпуск | 23 |
