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Автор Alain Jacques
Автор Frédéric Vallino
Автор Francisco Serbena
Автор Amand George
Дата выпуска 2000-12-11
dc.description In situ observations by synchrotron x-ray topography were performed on initially dislocation-free silicon single crystals deformed in creep conditions at temperatures between 975 K and 1075 K, and tensile stresses equal to 22 MPa or 44 MPa, in order to study the multiplication of dislocations during the very first stages of plastic deformation. It could be seen that the first dislocations, created at Vickers micro-indents or at residual surface damage, did not develop in a strictly planar way: prismatic half loops, gliding simultaneously on two {111} planes, were commonly observed. Cross-slip events appeared to be quite frequent, in the bulk as well as at free surfaces. Groups of similar dislocations soon exhibited irregular shapes with cusps and trailing dipoles, which was taken as an indication that they developed jogs during their motion. Several configurations of dislocation sources formed by the mobile dislocations were observed and are described in detail. The formation of new sources usually involved cross-slip. The role of jogs formed by forest-cutting seems important. The efficiency of sources was strongly limited by the lack of stability of the cross-slipped segments, which acted as poles for the Frank-Read mechanism.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Dislocation multiplication in silicon at the onset of plasticity observed by in situ synchrotron x-ray topography
Тип paper
DOI 10.1088/0953-8984/12/49/304
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 12
Первая страница 10045
Последняя страница 10058
Выпуск 49

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