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Автор J C Nabity
Автор M N Wybourne
Дата выпуска 1990-04-02
dc.description Electric field heating of electrons in thin metal films deposited on silicon substrates has been used to determine the phonon transmission across the metal-silicon interface. A simple rate equation model is used to fit the electron temperature as a function of applied field. From the fit the authors have established that the phonon transmission deviates from the usual acoustic mismatch model. The authors find the phonon escape to comprise two components: ballistic escape of phonons from the film and strong scattering close to the interface.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Phonon escape from electrically heated metal films on silicon
Тип lett
DOI 10.1088/0953-8984/2/13/022
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 2
Первая страница 3125
Последняя страница 3129
Аффилиация J C Nabity; Dept. of Phys., Oregon Univ., Eugene, OR, USA
Аффилиация M N Wybourne; Dept. of Phys., Oregon Univ., Eugene, OR, USA
Выпуск 13

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