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Автор D Neerinck
Автор H Vanderstraeten
Автор L Stockman
Автор J -P Locquet
Автор Y Bruynseraede
Автор I K Schuller
Дата выпуска 1990-05-07
dc.description Extended X-ray diffraction experiments have been used to investigate the structure of Pb/Ge multilayers with a small (<15) number of bilayers. The detailed finite size structure in the X-ray diffraction profiles indicates that the multilayers are of very high quality. The authors present a one-dimensional kinematical calculation for these diffraction profiles, including continuous and discrete random fluctuations in layer thickness. The introduction of both continuous and discrete fluctuations causes a decrease in the number of secondary single-layer 'finite size' maxima in the high angle region, in agreement with the experimental results. No quantitative agreement is reached for the low angle region, which shows more finite size structure than predicted by the fluctuations deduced from the high angle region.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Finite size effects in crystalline/amorphous multilayers
Тип paper
DOI 10.1088/0953-8984/2/18/007
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 2
Первая страница 4111
Последняя страница 4118
Аффилиация D Neerinck; Lab. voor Vaste Stof-Fysika en Magnetisme, Katholieke Univ., Leuven, Belgium
Аффилиация H Vanderstraeten; Lab. voor Vaste Stof-Fysika en Magnetisme, Katholieke Univ., Leuven, Belgium
Аффилиация L Stockman; Lab. voor Vaste Stof-Fysika en Magnetisme, Katholieke Univ., Leuven, Belgium
Аффилиация J -P Locquet; Lab. voor Vaste Stof-Fysika en Magnetisme, Katholieke Univ., Leuven, Belgium
Аффилиация Y Bruynseraede; Lab. voor Vaste Stof-Fysika en Magnetisme, Katholieke Univ., Leuven, Belgium
Аффилиация I K Schuller; Lab. voor Vaste Stof-Fysika en Magnetisme, Katholieke Univ., Leuven, Belgium
Выпуск 18

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