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Автор R G Biswas
Автор T E Whall
Автор N L Mattey
Автор S M Newstead
Автор E H C Parker
Автор M J Kearney
Дата выпуска 1993-04-05
dc.description The authors present the results of low-temperature transport measurements on 'metallic' Si:Sb doping layers with nominal widths of 10 nm, 20 nm and 80 nm. There is clear evidence of weak localization and interaction corrections to the transport coefficients and for a 3D to 2D transition as the layer width decreases-the first observation of these effects in this system. Of particular interest is the fact that the experimental results are in good quantitative agreement with most aspects of the theory, despite the highly disordered and multi-sub-band nature of the samples.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Low-temperature transport in Si:Sb ultra-thin doping layers
Тип lett
DOI 10.1088/0953-8984/5/14/002
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 5
Первая страница L201
Последняя страница L206
Аффилиация R G Biswas; Dept. of Phys., Warwick Univ., Coventry, UK
Аффилиация T E Whall; Dept. of Phys., Warwick Univ., Coventry, UK
Аффилиация N L Mattey; Dept. of Phys., Warwick Univ., Coventry, UK
Аффилиация S M Newstead; Dept. of Phys., Warwick Univ., Coventry, UK
Аффилиация E H C Parker; Dept. of Phys., Warwick Univ., Coventry, UK
Аффилиация M J Kearney; Dept. of Phys., Warwick Univ., Coventry, UK
Выпуск 14

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