Argon and krypton Auger spectra induced by ion bombardment of aluminium and silicon surfaces
A P Nixon; T E Gallon; F Yousif; J A D Matthew; A P Nixon; Dept. of Phys., York Univ., UK; T E Gallon; Dept. of Phys., York Univ., UK; F Yousif; Dept. of Phys., York Univ., UK; J A D Matthew; Dept. of Phys., York Univ., UK
Журнал:
Journal of Physics: Condensed Matter
Дата:
1994-04-04
Аннотация:
Measurements are reported of Auger (autoionization) spectra of Ar and Kr produced by bombarding Al and Si substrates with Ar<sup>+</sup> and Kr<sup>+</sup> ions in the 110 eV-5 keV energy range. These are shown to be consistent with the simple Doppler model suggested, for Ne on Al and Si, in a previous paper. Once corrected using the model, the observed Auger energies are shown to correspond to theoretical predictions produced using Dirac-Fock calculations.
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