Автор |
Y Shi |
Автор |
F M Wu |
Автор |
Y D Zheng |
Автор |
M Suezawa |
Автор |
M Imai |
Автор |
K Sumino |
Дата выпуска |
1994-10-10 |
dc.description |
The optically active process of higher-order bands (HOBs) in fast-neutron-irradiated float-zone silicon has been investigated at low temperature using a Fourier-transform infrared spectrometer with optical excitation. It is found that the photoexcitation process follows an exponential time dependence and that the decay is logarithmic with a decay time constant of 10<sup>5</sup> s at 7 K. The saturation value of the absorption coefficients depends on the logarithm of the illumination-light intensity. These characteristics are associated with the slow relaxation of photoexcited carriers originating mainly from defect clusters. The relaxation behaviour of photoexcited carriers has been analysed using the macroscopic-barrier model, which is in good agreement with the observations. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
The optically active process of higher-order bands in neutron-irradiated silicon |
Тип |
paper |
DOI |
10.1088/0953-8984/6/41/026 |
Electronic ISSN |
1361-648X |
Print ISSN |
0953-8984 |
Журнал |
Journal of Physics: Condensed Matter |
Том |
6 |
Первая страница |
8645 |
Последняя страница |
8653 |
Аффилиация |
Y Shi; Dept. of Phys., Nanjing Univ., China |
Аффилиация |
F M Wu; Dept. of Phys., Nanjing Univ., China |
Аффилиация |
Y D Zheng; Dept. of Phys., Nanjing Univ., China |
Аффилиация |
M Suezawa; Dept. of Phys., Nanjing Univ., China |
Аффилиация |
M Imai; Dept. of Phys., Nanjing Univ., China |
Аффилиация |
K Sumino; Dept. of Phys., Nanjing Univ., China |
Выпуск |
41 |