Автор |
L Liszkay |
Автор |
C Corbel |
Автор |
L Baroux |
Автор |
P Hautojarvi |
Автор |
A Declemy |
Автор |
P O Renault |
Дата выпуска |
1995-11-06 |
dc.description |
Slow-positron-beam studies on aluminium-implanted mercury cadmium telluride are presented. Single crystals were implanted with 320 keV Al ions up to 3*10<sup>12</sup> fluence at room temperature and 1*10<sup>14</sup> ions cm<sup>-2</sup> fluence at 100 K and 300 K. We discuss the effect of the native oxide layer on the positron spectra and show that the oxide-crystal interface acts as a strong positron trap. By using both the core (W) and the valence (S) annihilation fractions we can separate oxide-related positron effects at the surface from the damage in the crystal. Implantation introduces small vacancy clusters. On the basis of the relative Doppler parameters of the defects created (S<sub>d</sub>/S<sub>b</sub>=1.05, W<sub>d</sub>/W<sub>b</sub>=0 80), they are most probably divacancies. The divacancy profile is found to extend from the surface to a depth comparable to the mean Al implantation depth. At room temperature divacancy creation reaches saturation at 3*10<sup>12</sup> ions cm<sup>-2</sup> fluence with an estimated divacancy concentration of 4*10<sup>16</sup> cm<sup>-3</sup>. After implantation at low temperature (100 K) and annealing at 360 K the divacancy creation exceeds 10<sup>18</sup> cm<sup>-3</sup>. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
Implantation-induced defects in Hg<sub>0.78</sub>Cd<sub>0.22</sub>Te studied using slow positrons |
Тип |
paper |
DOI |
10.1088/0953-8984/7/45/008 |
Electronic ISSN |
1361-648X |
Print ISSN |
0953-8984 |
Журнал |
Journal of Physics: Condensed Matter |
Том |
7 |
Первая страница |
8529 |
Последняя страница |
8538 |
Аффилиация |
L Liszkay; INSTN-UEPEM CE Saclay, Gif-sur-Yvette, France |
Аффилиация |
C Corbel; INSTN-UEPEM CE Saclay, Gif-sur-Yvette, France |
Аффилиация |
L Baroux; INSTN-UEPEM CE Saclay, Gif-sur-Yvette, France |
Аффилиация |
P Hautojarvi; INSTN-UEPEM CE Saclay, Gif-sur-Yvette, France |
Аффилиация |
A Declemy; INSTN-UEPEM CE Saclay, Gif-sur-Yvette, France |
Аффилиация |
P O Renault; INSTN-UEPEM CE Saclay, Gif-sur-Yvette, France |
Выпуск |
45 |