Comment on the effects of overlayer thicknesses on the electrical resistivity of polycrystalline Cu/Cr double-layered thin films
Satish Vitta; Satish Vitta; Department of Metallurgical Engineering and Materials Science, Indian Institute of Technology, Bombay 400 076, India
Журнал:
Journal of Physics: Condensed Matter
Дата:
1996-06-24
Аннотация:
The oscillatory behaviour of the electrical resistivity of Cu/Cr double layers where the Cr layer thickness is > 7.5 nm has been attributed to the incommensurate - commensurate phase transition in Cr [1]. The present work shows that the resistivity variation is not due to the incommensurate - commensurate phase transition in Cr.
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