| Автор | S F Cui |
| Автор | G M Luo |
| Автор | M Li |
| Автор | Z H Mai |
| Автор | Q Cui |
| Автор | J M Zhou |
| Автор | X M Jiang |
| Автор | W L Zhang |
| Дата выпуска | 1997-04-07 |
| dc.description | The interface roughness and scaling exponent of strained-layer superlattices (SLSs) grown by molecular beam epitaxy (MBE) have been measured by x-ray reflectivity and diffuse-scattering methods. We have found that for samples grown under identical conditions the root mean square (rms) roughnesses , the roughness exponents (h), and the lateral correlation length are dependent upon the thickness and/or the substrate temperatures of the superlattice. The incorporation of a surfactant, such as antimony, can retard interface widening and smooth the interface. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | The interface roughness exponent in superlattices |
| Тип | paper |
| DOI | 10.1088/0953-8984/9/14/005 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 9 |
| Первая страница | 2891 |
| Последняя страница | 2902 |
| Выпуск | 14 |
