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Автор Masao Iwamatsu
Автор Makoto Fujiwara
Автор Naohisa Happo
Автор Kenju Horii
Дата выпуска 1997-11-10
dc.description The one- and two-electron ground-state energies of singly and doubly charged silicon (Si) dots modelled by a sphere covered with a silicon dioxide layer embedded in various dielectric media can be calculated as functions of the sphere size and the thickness of the oxide by extending the work of Allan et al and Babic et al. The electron-self-polarization, electron - electron and electron-polarization energies are treated by first-order perturbation theory, taking the confined free-electron state as the unperturbed state. By changing the thickness of the oxides or the surrounding dielectric medium, the applied voltage required for the tunnelling of one electron when one electron already exists inside the dot is greatly reduced. We discuss the possible consequence of electron tunnelling in a Si dot and the electroluminescence of porous Si.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Effects of dielectric discontinuity on the ground-state energy of charged Si dots covered with a layer
Тип paper
DOI 10.1088/0953-8984/9/45/016
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 9
Первая страница 9881
Последняя страница 9892
Аффилиация Masao Iwamatsu; Department of Computer Engineering, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-31, Japan
Аффилиация Makoto Fujiwara; Department of Computer Engineering, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-31, Japan
Аффилиация Naohisa Happo; Department of Computer Engineering, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-31, Japan
Аффилиация Kenju Horii; Department of Computer Engineering, Hiroshima City University, 3-4-1 Ozuka-higashi, Asaminami-ku, Hiroshima 731-31, Japan
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