| Автор | Jaeyong Lee |
| Автор | G Lauhoff |
| Автор | C Fermon |
| Автор | S Hope |
| Автор | J A C Bland |
| Автор | J Ph Schillé |
| Автор | G van der Laan |
| Автор | C Chappert |
| Автор | P Beauvillain |
| Дата выпуска | 1997-03-03 |
| dc.description | We have directly compared the values of the magnetic moment obtained from x-ray magnetic circular dichroism (XMCD) measurements with those obtained from polarized neutron reflection (PNR) measurements on strained Ni films grown on Cu(001)/Si(001). The PNR measurements show that the absolute magnetic moments differ from that of bulk Ni. We find agreement within experimental errors between the two magnetometry measurements, confirming that the XMCD sum rules are applicable to this strained low-symmetric system. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | A direct test of x-ray magnetic circular dichroism sum rules for strained Ni films using polarized neutron reflection |
| Тип | lett |
| DOI | 10.1088/0953-8984/9/9/005 |
| Electronic ISSN | 1361-648X |
| Print ISSN | 0953-8984 |
| Журнал | Journal of Physics: Condensed Matter |
| Том | 9 |
| Первая страница | L137 |
| Последняя страница | L143 |
| Выпуск | 9 |
