An apparatus for studying metal crystal surfaces with ion scattering techniques is described. These techniques are low-energy ion scattering (LEIS) ion-neutralisation spectroscopy (INS) and low-energy recoil scattering (LERS). Angles of incidence and detection as well as the energies of incoming and outgoing particles can be controlled very precisely. Furthermore, coincidence measurements between scattered projectiles and electrons or between scattered projectiles and recoil ions can be performed. Ultraviolet photoelectron spectroscopy (UPS) and low-energy electron diffraction (LEED) are available as additional techniques.