| Автор | Haibo Zhang |
| Автор | Akio Takaoka |
| Дата выпуска | 1999-01-01 |
| dc.description | Height variation of a tilted specimen may alter the magnification and image rotation because of re-focusing with an objective lens. Evaluating the height of the tilted specimen by means of the objective excitation, we derive approximate expressions for the alteration of the magnification and the image rotation. They are in the form of a second-order expansion of the lens-current variation. Theoretical results are validated by measurements in an ultra-high-voltage electron microscope. These expressions are especially useful for correcting images in the quantitative application to electron tomography. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Alteration of magnification and image rotation in tilt series of electron microscopic images |
| Тип | note |
| DOI | 10.1088/0957-0233/10/1/013 |
| Electronic ISSN | 1361-6501 |
| Print ISSN | 0957-0233 |
| Журнал | Measurement Science and Technology |
| Том | 10 |
| Первая страница | N3 |
| Последняя страница | N6 |
| Выпуск | 1 |
