| Автор | David Vakman |
| Дата выпуска | 2000-10-01 |
| dc.description | For traditional local frequency measurement, random phase modulation in a signal is indistinguishable from noise distortion. As a result, short-term instability of precision generators is measured with appreciable errors. The global frequency of the analytic signal provides much higher precision and its measurement removes the noise influence. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | New high precision frequency measurement |
| Тип | paper |
| DOI | 10.1088/0957-0233/11/10/310 |
| Electronic ISSN | 1361-6501 |
| Print ISSN | 0957-0233 |
| Журнал | Measurement Science and Technology |
| Том | 11 |
| Первая страница | 1493 |
| Последняя страница | 1497 |
| Аффилиация | David Vakman; 213 Bennett Avenue, Apartment 2D, New York, NY 10040, USA |
| Выпуск | 10 |
