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Автор V Pische
Автор L Peccoud
Автор P Lassagne
Дата выпуска 1992-08-01
dc.description The aim of this study is to characterize the SiO<sub>2</sub> etching process developed in a magnetic triode experimental system fed by C<sub>2</sub>F<sub>6</sub>. The effect of some experimental parameter variation, namely of pressure, C<sub>2</sub>F<sub>6</sub> flow, magnetic field intensity, upper electrode power (40 MHz), lower electrode power (13.56 MHz) on the SiO<sub>2</sub> etch rate has been studied and related to the absolute value of the self-induced voltage of the lower substrate electrode. The gas phase has been investigated by means of actinometric optical emission spectroscopy. Good correlation has been found between the gas density trends of CF<sub>2</sub> radicals and F atoms and the behaviour of etch rate, showing a significant dependence of the SiO<sub>2</sub> etching rate on both ion energy and F:CF<sub>2</sub> density ratio.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Actinometric study on SiO<sub>2</sub> etching by a dual-frequency magnetic triode reactor
Тип paper
DOI 10.1088/0963-0252/1/3/002
Electronic ISSN 1361-6595
Print ISSN 0963-0252
Журнал Plasma Sources Science and Technology
Том 1
Первая страница 151
Последняя страница 155
Аффилиация V Pische; LETI, DMEL, CENG, Grenoble, France
Аффилиация L Peccoud; LETI, DMEL, CENG, Grenoble, France
Аффилиация P Lassagne; LETI, DMEL, CENG, Grenoble, France
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