Автор |
H Sugai |
Автор |
H Toyoda |
Автор |
K Nakano |
Автор |
N Isomura |
Дата выпуска |
1995-08-01 |
dc.description |
A biased optical probe (BOP) method, i.e. novel technique for measurements of the electron energy distribution function (EEDF) in a range of such high energies as 10-50 eV has been developed. This method is based on the optical emission induced by electrons passing through a negatively biased mesh in a plasma. The BOP method was used to measure the EEDF in a DC glow discharge in He/Xe mixture while the low-energy part (<10 eV) of the EEDF was measured using the conventional Druyvesteyn method. The measured distribution function considerably deviates from an ideal Maxwellian distribution, because of abundant high-energy electrons generated in a cathode fall. On the contrary, the EEDF measured in a low-pressure inductive RF discharge was found to follow a single Maxwellian distribution over a wide energy range. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Название |
A biased optical probe method for measurements of electron energy distribution in a plasma |
Тип |
paper |
DOI |
10.1088/0963-0252/4/3/006 |
Electronic ISSN |
1361-6595 |
Print ISSN |
0963-0252 |
Журнал |
Plasma Sources Science and Technology |
Том |
4 |
Первая страница |
366 |
Последняя страница |
372 |
Аффилиация |
H Sugai; Dept. of Electr. Eng., Nagoya Univ., Japan |
Аффилиация |
H Toyoda; Dept. of Electr. Eng., Nagoya Univ., Japan |
Аффилиация |
K Nakano; Dept. of Electr. Eng., Nagoya Univ., Japan |
Аффилиация |
N Isomura; Dept. of Electr. Eng., Nagoya Univ., Japan |
Выпуск |
3 |