| dc.description |
A three-dimensional grain model, in which the grains are represented by regular truncated octahedra, has been developed to study probabilistic time-dependent intergranular failure in polycrystalline arrays. In this model, grain boundary facets are assumed to fail randomly in time, as a function of the facet normal stress. A simple approximate method for calculating the load shed by failed facets and a reasonable choice of failure criterion complete the model. This leads to a conceptually simple, but computationally complex, model capable of handling assemblages consisting of relatively large numbers (> 5000) of grains. The predicted scatter in the times-to-failure and the variation in number of failed facets with time are in quite reasonable agreement with available experimental data. |
