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Автор B V Kobrin
Автор V P Shantarovich
Автор M D Mikhailov
Автор E Yu Turkina
Дата выпуска 1984-03-01
dc.description The effect of metal admixtures on the structure and imperfections of chalcogenide glassy semiconductors is investigated for Ga admixture in GeSe<sub>4</sub> glass. Information is obtained by the positron annihilation technique.A microcrystalline phase in glass under doping at low admixture concentrations (about 0.01 at %) is indicated. The characteristic sizes of microinclusions and the amount of admixture atoms they contain are estimated. New aspects of the earlier interpretation (on the basis of the "induction effect") of the doping effect on electrophysical properties of glass are found.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Positron Annihilation Study of Doping Effect in Chalcogenide Glassy Semiconductors
Тип paper
DOI 10.1088/0031-8949/29/3/015
Electronic ISSN 1402-4896
Print ISSN 0031-8949
Журнал Physica Scripta
Том 29
Первая страница 276
Последняя страница 278
Выпуск 3

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