Мобильная версия

Доступно журналов:

3 288

Доступно статей:

3 891 637

 

Скрыть метаданые

Автор I L Shul'pina
Автор E V Astrova
Автор V V Ratnikov
Автор A D Remenyuk
Автор A G Tkachenko
Дата выпуска 2001-05-21
dc.description Microchannel (macroporous) silicon obtained by photoelectrochemical etching of cylindrical pores with high aspect ratio of the pore length to the diameter has been studied by x-ray diffractometry and topography. It is shown that the crystal lattice of microchannel silicon is practically not distorted. The channels induce additional diffuse scattering of x-rays. However, thermal oxidation leads to strong distortion of planes, both parallel and normal to the crystal surface, and also to the generation of dislocations. It is shown that x-ray topography allows one to obtain the image of an inner boundary between microchannel silicon and the substrate, to estimate its quality and to define its position in the sample non-destructively.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Characterization of microchannel Si by HRXD and topography
Тип paper
DOI 10.1088/0022-3727/34/10A/329
Electronic ISSN 1361-6463
Print ISSN 0022-3727
Журнал Journal of Physics D: Applied Physics
Том 34
Первая страница A140
Последняя страница A143
Аффилиация I L Shul'pina; Ioffe Physical-Technical Institute, Russian Academy of Sciences, Polytekhnicheskaya, 26, 194021, St-Petersburg, Russia
Аффилиация E V Astrova; Ioffe Physical-Technical Institute, Russian Academy of Sciences, Polytekhnicheskaya, 26, 194021, St-Petersburg, Russia
Аффилиация V V Ratnikov; Ioffe Physical-Technical Institute, Russian Academy of Sciences, Polytekhnicheskaya, 26, 194021, St-Petersburg, Russia
Аффилиация A D Remenyuk; Ioffe Physical-Technical Institute, Russian Academy of Sciences, Polytekhnicheskaya, 26, 194021, St-Petersburg, Russia
Аффилиация A G Tkachenko; Ioffe Physical-Technical Institute, Russian Academy of Sciences, Polytekhnicheskaya, 26, 194021, St-Petersburg, Russia
Выпуск 10A

Скрыть метаданые