| Автор | Nimalasuriya, T |
| Автор | Curry, J J |
| Автор | Sansonetti, C J |
| Автор | Ridderhof, E J |
| Автор | Shastri, S D |
| Автор | Flikweert, A J |
| Автор | Stoffels, W W |
| Автор | Haverlag, M |
| Автор | van der Mullen, J J A M |
| Дата выпуска | 2007-05-07 |
| dc.description | Segregation of elemental Dy in a DyI<sub>3</sub>–Hg metal-halide high-intensity discharge lamp has been observed with x-ray induced fluorescence. Significant radial and axial Dy segregation are seen, with the axial segregation characterized by a Fischer parameter value of λ = 0.215 ± 0.002 mm<sup>−1</sup>. This is within 7% of the value (λ = 0.20 ± 0.01 mm<sup>−1</sup>) obtained by Flikweert et al (2005 J. Appl. Phys. 98 073301) based on laser absorption by neutral Dy atoms. Elemental I is seen to exhibit considerably less axial and radial segregation. Some aspects of the observed radial segregation are compatible with a simplified fluid picture describing two main transition regions in the radial coordinate. The first transition occurs in the region where DyI<sub>3</sub> molecules are in equilibrium with neutral Dy atoms. The second transition occurs where neutral Dy atoms are in equilibrium with ionized Dy. These measurements are part of a larger study on segregation in metal-halide lamps under a variety of conditions. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | 2007 IOP Publishing Ltd |
| Название | X-ray induced fluorescence measurement of segregation in a DyI<sub>3</sub>–Hg metal-halide lamp |
| Тип | paper |
| DOI | 10.1088/0022-3727/40/9/025 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 40 |
| Первая страница | 2831 |
| Последняя страница | 2838 |
| Последняя страница | 2838 |
| Аффилиация | Nimalasuriya, T; Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands |
| Аффилиация | Curry, J J; National Institute of Standards and Technology, 100 Bureau Drive, Stop 8422, Gaithersburg, MD 20899-8422, USA |
| Аффилиация | Sansonetti, C J; National Institute of Standards and Technology, 100 Bureau Drive, Stop 8422, Gaithersburg, MD 20899-8422, USA |
| Аффилиация | Ridderhof, E J; Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands |
| Аффилиация | Shastri, S D; Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA |
| Аффилиация | Flikweert, A J; Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands |
| Аффилиация | Stoffels, W W; Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands |
| Аффилиация | Haverlag, M; Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands |
| Аффилиация | van der Mullen, J J A M; Department of Applied Physics, Eindhoven University of Technology, PO Box 513, 5600 MB Eindhoven, The Netherlands |
| Выпуск | 9 |
