| Автор | Chiang, Shirley |
| Дата выпуска | 2011-11-23 |
| dc.description | This review discusses nearly 30 years of scanning tunnelling microscopy (STM) work on high resolution imaging of numerous materials systems, giving a historical perspective on the field through the author's work. After a brief discussion of early STM and atomic force microscope (AFM) instrumentation development, the review discusses high resolution STM imaging on semiconductors, metals on semiconductors, Au(1 1 1), metal on metals including surface alloys, oxygen on metals, molecules adsorbed on metals, and AFM measurements of friction on graphite and mica. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | 2011 IOP Publishing Ltd |
| Название | Imaging atoms and molecules on surfaces by scanning tunnelling microscopy |
| Тип | paper |
| DOI | 10.1088/0022-3727/44/46/464001 |
| Electronic ISSN | 1361-6463 |
| Print ISSN | 0022-3727 |
| Журнал | Journal of Physics D: Applied Physics |
| Том | 44 |
| Первая страница | 464001 |
| Последняя страница | 464019 |
| Аффилиация | Chiang, Shirley; Department of Physics, University of California Davis, 1 Shields Avenue, Davis, CA 95616-8677, USA |
| Выпуск | 46 |
