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Автор Ping-Shine Shaw
Автор Uwe Arp
Автор Howard W Yoon
Автор Robert D Saunders
Автор Albert C Parr
Автор Keith R Lykke
Дата выпуска 2003-02-01
dc.description A new source-based radiometry beamline was recently constructed at the Synchrotron Ultraviolet Radiation Facility (SURF III). The goal of this beamline is to establish a national source standard with a wide spectral range from the far ultraviolet to the infrared by using the calculability of SURF III. The new beamline is a straight-through white-light beamline with few, if any, optical components involved in delivering the radiation to the user end-station for applications such as source and irradiance intercomparisons. Due to the low tunable operating electron energy of SURF III (from 380 MeV to less than 100 MeV), the beamline is uniquely suited to work in the ultraviolet to infrared spectral range. In this paper we discuss the design of the beamline and present first results on the vertical angular distribution of the radiation determined with filtered radiometers in the ultraviolet, visible and near-infrared spectral ranges.
Формат application.pdf
Издатель Institute of Physics Publishing
Название A SURF beamline for synchrotron source-based absolute radiometry
Тип paper
DOI 10.1088/0026-1394/40/1/328
Electronic ISSN 1681-7575
Print ISSN 0026-1394
Журнал Metrologia
Том 40
Первая страница S124
Последняя страница S127
Аффилиация Ping-Shine Shaw; National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA
Аффилиация Uwe Arp; National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA
Аффилиация Howard W Yoon; National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA
Аффилиация Robert D Saunders; National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA
Аффилиация Albert C Parr; National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA
Аффилиация Keith R Lykke; National Institute of Standards and Technology, 100 Bureau Dr, MS 8410, Gaithersburg, MD 20899-8410, USA
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