Мобильная версия

Доступно журналов:

3 288

Доступно статей:

3 891 637

 

Скрыть метаданые

Автор Zewail, Ahmed H.
Дата выпуска 2006
dc.description ▪ Abstract  In this review, we highlight the progress made in the development of 4D ultrafast electron diffraction (UED), crystallography (UEC), and microscopy (UEM) with a focus on concepts, methodologies, and prototypical applications. The joint atomic-scale resolutions in space and time, and sensitivity reached, make it possible to determine complex transient structures and assemblies in different phases. These applications include studies of isolated chemical reactions (molecular beams), interfaces, surfaces and nanocrystals, self-assembly, and 2D crystalline fatty-acid bilayers. In 4D UEM, we are now able, using timed, single-electron packets, to image nano-to-micro scale structures of materials and biological cells. Future applications of these methods are foreseen across areas of physics, chemistry, and biology.
Формат application.pdf
Издатель Annual Reviews
Копирайт Annual Reviews
Название 4D ULTRAFAST ELECTRON DIFFRACTION, CRYSTALLOGRAPHY, AND MICROSCOPY
DOI 10.1146/annurev.physchem.57.032905.104748
Print ISSN 0066-426X
Журнал Annual Review of Physical Chemistry
Том 57
Первая страница 65
Последняя страница 103
Аффилиация Zewail, Ahmed H.; Laboratory for Molecular Sciences and Physical Biology Center for Ultrafast Science and Technology, California Institute of Technology, Pasadena, California 91125; email: zewail@caltech.edu

Скрыть метаданые