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Автор Gao Fei
Автор Li Guo-Hua
Автор Zhang Jian-Hui
Автор Qin Fu-Guang
Автор Yao Zhen-Yu
Автор Liu Zhi-Kai
Автор Wang Zhan-Guo
Автор Lin Lan-Ying
Дата выпуска 2001-03-01
dc.description A CeO<sub>2</sub> film with a thickness of about 80 nm was deposited by a mass-analysed low-energy dual ion beam deposition technique on an Si(111) substrate. Reflection high-energy electron diffraction and x-ray diffraction measurements showed that the film is a single crystal. The tetravalent state of Ce in the film was confirmed by x-ray photoelectron spectroscopy measurements, indicating that stoichiometric CeO<sub>2</sub> was formed. Violet/blue light emission (379.5 nm) was observed at room temperature, which may be tentatively explained by charge transitions from the 4f band to the valence band of CeO<sub>2</sub>.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Growth and Photoluminescence of Epitaxial CeO<sub>2</sub> Film on Si (111) Substrate
Тип paper
DOI 10.1088/0256-307X/18/3/345
Electronic ISSN 1741-3540
Print ISSN 0256-307X
Журнал Chinese Physics Letters
Том 18
Первая страница 443
Последняя страница 444
Выпуск 3

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