| Автор | Ma De-Wei |
| Автор | Ye Zhi-Zhen |
| Автор | Huang Jing-Yun |
| Автор | Zhao Bing-Hui |
| Автор | Wan Shou-Ke |
| Автор | Sun Xue-Hao |
| Автор | Wang Zhan-Guo |
| Дата выпуска | 2003-06-01 |
| dc.description | Zn<sub>1-x</sub>Cd<sub>x</sub>O crystal thin films with different compositions were prepared on silicon and sapphire substrates by the dc reactive magnetron sputtering technique. X-ray diffraction measurements show that the Zn<sub>1-x</sub>Cd<sub>x</sub>O films are of completely (002)-preferred orientation for x≤0.6. For x = 0.8, the film is a mixture of ZnO hexagonal wurtzite crystals and CdO cubic crystals. For pure CdO, it is highly (200) preferential-oriented. Photoluminescence spectrum measurement shows that the Zn<sub>1-x</sub>Cd<sub>x</sub>O (x = 0.2) thin film has a redshift of 0.14 eV from that of ZnO reported previously. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Structural and Optical Characterization of Zn<sub>1-x</sub>Cd<sub>x</sub>O Thin Films Deposited by dc Reactive Magnetron Sputtering |
| Тип | paper |
| DOI | 10.1088/0256-307X/20/6/347 |
| Electronic ISSN | 1741-3540 |
| Print ISSN | 0256-307X |
| Журнал | Chinese Physics Letters |
| Том | 20 |
| Первая страница | 942 |
| Последняя страница | 943 |
| Выпуск | 6 |
