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Автор Zhou Zhong-Tang
Автор Guo Li-Wei
Автор Xing Zhi-Gang
Автор Ding Guo-Jian
Автор Zhang Jie
Автор Peng Ming-Zeng
Автор Jia Hai-Qiang
Автор Chen Hong
Автор Zhou Jun-Ming
Дата выпуска 2007-06-01
dc.description Semi-insulating GaN is grown by using a two-step AlN buffer layer by metalorganic chemical vapour deposition. The sheet resistance of as-grown semi-insulating GaN is dramatically increased to 10<sup>13</sup> Ω/sq by using two-step AlN buffer instead of the traditional low-temperature GaN buffer. The high sheet resistance of as-grown GaN over 10<sup>13</sup> Ω/sq is due to inserting an insulating buffer layer (two-step AlN buffer) between the high-temperature GaN layer and a sapphire substrate which blocks diffusion of oxygen and overcomes the weakness of generating high density carrier near interface of GaN and sapphire when a low-temperature GaN buffer is used. The result suggests that the high conductive feature of unintentionally doped GaN is mainly contributed from the highly conductive channel near interface between GaN and the sapphire substrate, which is indirectly manifested by room-temperature photoluminescence excited by an incident laser beam radiating on growth surface and on the substrate. The functions of the two-step AlN buffer layer in reducing screw dislocation and improving crystal quality of GaN are also discussed.
Формат application.pdf
Издатель Institute of Physics Publishing
Название Growth of Semi-Insulating GaN by Using Two-Step AlN Buffer Layer
Тип paper
DOI 10.1088/0256-307X/24/6/058
Electronic ISSN 1741-3540
Print ISSN 0256-307X
Журнал Chinese Physics Letters
Том 24
Первая страница 1641
Последняя страница 1644
Аффилиация Zhou Zhong-Tang; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Guo Li-Wei; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Xing Zhi-Gang; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Ding Guo-Jian; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Zhang Jie; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Peng Ming-Zeng; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Jia Hai-Qiang; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Chen Hong; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
Аффилиация Zhou Jun-Ming; Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, PO Box 603, Beijing 100080
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