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Автор Wang Wei
Автор Ma Dong-Ge
Дата выпуска 2010-01-01
dc.description A nonvolatile memory effect was observed in an organic thin-film transistor by introducing a Boating gate structure. The Boating gate was composed of an Al film in a thickness of nanometers, which was thermally deposited on a SiO2 insulator and exposed to air to spontaneously oxidize. It can be seen that the transistors exhibit significant hysteresis behaviors and storage circles in current-voltage characteristics in the dark and under illumination, indicating that the transistors may act as a nonvolatile memory element. The operational mechanism is discussed in the cases of dark and illumination via charge trapping by the Al floating gate.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт 2010 Chinese Physical Society and IOP Publishing Ltd
Название Nonvolatile Memory Effect in Organic Thin-Film Transistor Based on Aluminum Nanoparticle Floating Gate
Тип paper
DOI 10.1088/0256-307X/27/1/018503
Electronic ISSN 1741-3540
Print ISSN 0256-307X
Журнал Chinese Physics Letters
Том 27
Первая страница 18503
Последняя страница 18506
Выпуск 1

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