Aberration-free high-harmonic source generated with a two-colour field
Lambert, G.; Tissandier, F.; Gautier, J.; Hauri, C. P.; Zeitoun, P.; Valentin, C.; Marchenko, T.; Goddet, J.-P.; Ribière, M.; Sardinha, A.; Fajardo, M.; Hamouda, F.; Maynard, G.; Rey, G.; Sebban, S.; Lambert, G.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Tissandier, F.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Gautier, J.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Hauri, C. P.; Paul Scherrer Institute - 5232 Villigen, Switzerland; Zeitoun, P.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Valentin, C.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Marchenko, T.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Goddet, J.-P.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Ribière, M.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Sardinha, A.; Centro de Fisica dos Plasmas/Instituto Superior Técnico - Av. Rovisco Pais, 1049-001 Lisboa, Portugal, EU; Fajardo, M.; Centro de Fisica dos Plasmas/Instituto Superior Técnico - Av. Rovisco Pais, 1049-001 Lisboa, Portugal, EU; Hamouda, F.; Institut d'Electronique Fondamentale, Université Paris-sud - CNRS UHR 8622, 91405 Orsay, France, EU; Maynard, G.; Laboratoire de Physique des Gaz et des Plasmas, Université Paris-Sud - CNRS UMR 8578, 91405 Orsay, France, EU; Rey, G.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU; Sebban, S.; Laboratoire d'Optique Appliquée, ENSTA-CNRS-Ecole Polytechnique - Chemin de la Hunière, 91761 Palaiseau, France, EU
Журнал:
EPL (Europhysics Letters)
Дата:
2010-01-01
Аннотация:
Imaging experiments of ultrafast phenomena of matter at nanometre-scale require intense, short pulse duration and diffraction-limited soft–X-ray beams, nowadays almost only provided by free-electron lasers. Here, we focused on a table-top soft–X-ray source, which fulfils these fundamental criteria and in addition presents high temporal coherence, the high harmonics generated with a two-colour field (ω+2ω). These harmonics revealed to be free from aberration just by slightly spatially filtering the laser used for generation (ω). Indeed, the measured wavefront distortions, equal to λ/17 RMS at 44 nm, correspond to a diffraction-limited beam. This behaviour is explained by an additional spatial nonlinear filtering effect of the driving laser wavefront, induced here in our particular but simple geometrical configuration of generation by the 2ω component.
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