| Автор | Y Liu |
| Автор | H Luo |
| Автор | T Yang |
| Автор | X Leng |
| Автор | X F Wu |
| Автор | J W Lin |
| Автор | Z H Wang |
| Автор | H M Luo |
| Автор | S Y Ding |
| Дата выпуска | 2002-03-01 |
| dc.description | We have measured the temperature dependence of the resistance of Tl<sub>2</sub>Ba<sub>2</sub>CaCu<sub>2</sub>O<sub>8+x</sub> (Tl-2212) thin film at various magnetic fields parallel and normal to the c-axis. Then the U(H) relationship and irreversibility line were obtained. An important parameter n in the material equation of the Tl-2212 thin film is obtained from the U(H) relationship. The V–I characteristic curves at different applied magnetic fields and temperatures were also measured. To testify the equivalence of the two measurements, we calculated V–I curves of the same thin film by solving the flux creep equation with the obtained material equation. A comparison between the independently measured and calculated V–I curves shows a satisfactory agreement. It is, therefore, concluded that we can combine the resistive broadening R–T measurement, which is conducted at a low current density and high temperature and the V–I curve, which can be carried out at a much lower temperature, expanding the range of temperature and current density in exploring the dynamics. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Название | Transport properties in Tl-2212 film |
| Тип | paper |
| DOI | 10.1088/0953-2048/15/3/318 |
| Electronic ISSN | 1361-6668 |
| Print ISSN | 0953-2048 |
| Журнал | Superconductor Science and Technology |
| Том | 15 |
| Первая страница | 375 |
| Последняя страница | 380 |
| Аффилиация | Y Liu; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | H Luo; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | T Yang; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | X Leng; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | X F Wu; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | J W Lin; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | Z H Wang; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | H M Luo; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Аффилиация | S Y Ding; Department of Physics, National Laboratory of Solid State Microstructures, Nanjing University, Nanjing 210093, Peopleʼs Republic of China |
| Выпуск | 3 |
