| Автор | Leach, Jan E. |
| Автор | Vera Cruz, Casiana M. |
| Автор | Bai, Jianfa |
| Автор | Leung, Hei |
| Дата выпуска | 2001 |
| dc.description | ▪ Abstract Host plant resistance has been used extensively for disease control in many crop species; however, the resistance conferred by many sources is not durable as a result of rapid changes in the pathogen. Although many resistance genes have been identified in plant germplasm, there is no easy way to predict the quality or durability of these resistance genes. In this review, we revisit the hypothesis that resistance genes imposing a high penalty to the pathogen for adaptation will likely be durable. By elucidating the molecular changes involved in pathogen adaptation and the associated fitness cost, a proactive approach may be developed to predict the durability of resistance genes available for deployment. |
| Формат | application.pdf |
| Издатель | Annual Reviews |
| Копирайт | Annual Reviews |
| Название | PATHOGEN FITNESS PENALTY AS A PREDICTOR OF DURABILITY OF DISEASE RESISTANCE GENES |
| DOI | 10.1146/annurev.phyto.39.1.187 |
| Print ISSN | 0066-4286 |
| Журнал | Annual Review of Phytopathology |
| Том | 39 |
| Первая страница | 187 |
| Последняя страница | 224 |
| Аффилиация | Leach, Jan E.; Department of Plant Pathology, 4024 Throckmorton Plant Sciences Center, Kansas State University, Manhattan, Kansas e-mail: jeleach@ksu.edu |
