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Автор , N Menou
Автор Muller, Ch
Автор Baturin, I S
Автор Kuznetsov, D K
Автор Shur, V Ya
Автор Hodeau, J L
Автор Schneller, T
Дата выпуска 2005-12-07
dc.description Highly brilliant synchrotron x-ray radiation was used to measure in situ the microstructural response of a ferroelectric capacitor subjected to bipolar rectangular pulses. High-resolution x-ray diffraction experiments were performed on a (111)-oriented PbZr<sub>0.45</sub>Ti<sub>0.55</sub>O<sub>3</sub> thin film with a composition in the morphotropic region and sandwiched between two platinum electrodes. From original real time measurements, the microstructural changes with electrical cycling have been evidenced and correlated with the observed polarization fatigue measured during the x-ray diffraction experiment. From concomitant variations of the diffracted intensity and the switching current maximum, several mechanisms have been discussed as a possible origin of the polarization fatigue: field induced phase transformation, oxygen vacancy self-ordering and widening of the internal bulk screening field distribution function during cyclic switching.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт IOP Publishing Ltd
Название In situ synchrotron x-ray diffraction study of electrical field induced fatigue in Pt/PbZr<sub>0.45</sub>Ti<sub>0.55</sub>O<sub>3</sub>/Pt ferroelectric capacitors
Тип paper
DOI 10.1088/0953-8984/17/48/018
Electronic ISSN 1361-648X
Print ISSN 0953-8984
Журнал Journal of Physics: Condensed Matter
Том 17
Первая страница 7681
Последняя страница 7688
Аффилиация , N Menou; L2MP, Laboratoire Matériaux et Microélectronique de Provence, UMR CNRS 6137, Université du Sud Toulon Var, BP 20132, F-83957 La Garde Cedex, France
Аффилиация Muller, Ch; L2MP, Laboratoire Matériaux et Microélectronique de Provence, UMR CNRS 6137, Université du Sud Toulon Var, BP 20132, F-83957 La Garde Cedex, France ;
Аффилиация Baturin, I S; Institute of Physics and Applied Mathematics, Ural State University, Lenin Avenue 51, 620083 Ekaterinburg, Russia
Аффилиация Kuznetsov, D K; Institute of Physics and Applied Mathematics, Ural State University, Lenin Avenue 51, 620083 Ekaterinburg, Russia
Аффилиация Shur, V Ya; Institute of Physics and Applied Mathematics, Ural State University, Lenin Avenue 51, 620083 Ekaterinburg, Russia
Аффилиация Hodeau, J L; Laboratoire de Cristallographie, BP 166, F-38042 Grenoble Cedex 9, France
Аффилиация Schneller, T; Institut fuer Werkstoffe der Elektrotechnik, RWTH Aachen, D-52056 Aachen, Germany
Выпуск 48

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