| Автор | Trevethan, Thomas |
| Автор | Shluger, Alexander |
| Дата выпуска | 2009-07-01 |
| dc.description | We present the results of theoretical modelling that predicts how a process of transfer of single electrons between two defects on an insulating surface can be induced using a scanning force microscope tip. A model but realistic system is employed which consists of a neutral oxygen vacancy and a noble metal (Pt or Pd) adatom on the MgO(001) surface. We show that the ionization potential of the vacancy and the electron affinity of the metal adatom can be significantly modified by the electric field produced by an ionic tip apex at close approach to the surface. The relative energies of the two states are also a function of the separation of the two defects. Therefore the transfer of an electron from the vacancy to the metal adatom can be induced either by the field effect of the tip or by manipulating the position of the metal adatom on the surface. |
| Формат | application.pdf |
| Издатель | Institute of Physics Publishing |
| Копирайт | IOP Publishing Ltd |
| Название | Controlling electron transfer processes on insulating surfaces with the non-contact atomic force microscope |
| Тип | paper |
| DOI | 10.1088/0957-4484/20/26/264019 |
| Electronic ISSN | 1361-6528 |
| Print ISSN | 0957-4484 |
| Журнал | Nanotechnology |
| Том | 20 |
| Первая страница | 264019 |
| Последняя страница | 264026 |
| Аффилиация | Trevethan, Thomas; Department of Physics and Astronomy, University College London, Gower Street, London WC1E 6BT, UK ; WPI Advanced Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan |
| Аффилиация | Shluger, Alexander; Department of Physics and Astronomy, University College London, Gower Street, London WC1E 6BT, UK ; WPI Advanced Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan |
| Выпуск | 26 |
