Мобильная версия

Доступно журналов:

3 288

Доступно статей:

3 891 637

 

Скрыть метаданые

Автор Pala, M G
Автор Baltazar, S
Автор Martins, F
Автор Hackens, B
Автор Sellier, H
Автор Ouisse, T
Автор Bayot, V
Автор Huant, S
Дата выпуска 2009-07-01
dc.description We study scanning gate microscopy (SGM) in open quantum rings obtained from buried semiconductor InGaAs/InAlAs heterostructures. By performing a theoretical analysis based on the Keldysh–Green function approach we interpret the radial fringes observed in experiments as the effect of randomly distributed charged defects. We associate SGM conductance images with the local density of states (LDOS) of the system. We show that such an association cannot be made with the current density distribution. By varying an external magnetic field we are able to reproduce recursive quasi-classical orbits in LDOS and conductance images, which bear the same periodicity as the Aharonov–Bohm effect.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт IOP Publishing Ltd
Название Scanning gate microscopy of quantum rings: effects of an external magnetic field and of charged defects
Тип paper
DOI 10.1088/0957-4484/20/26/264021
Electronic ISSN 1361-6528
Print ISSN 0957-4484
Журнал Nanotechnology
Том 20
Первая страница 264021
Последняя страница 264025
Аффилиация Pala, M G; IMEP-LAHC, Grenoble INP Minatec, BP 257, F-38016 Grenoble, France
Аффилиация Baltazar, S; IMEP-LAHC, Grenoble INP Minatec, BP 257, F-38016 Grenoble, France
Аффилиация Martins, F; CERMIN, DICE Lab, UCL, B-1348 Louvain-la-Neuve, Belgium
Аффилиация Hackens, B; CERMIN, DICE Lab, UCL, B-1348 Louvain-la-Neuve, Belgium
Аффилиация Sellier, H; Institut Néel, CNRS and Université Joseph Fourier, BP 166, F-38042 Grenoble, France
Аффилиация Ouisse, T; LMGP, Grenoble INP Minatec, F-38016 Grenoble, France
Аффилиация Bayot, V; CERMIN, DICE Lab, UCL, B-1348 Louvain-la-Neuve, Belgium ; Institut Néel, CNRS and Université Joseph Fourier, BP 166, F-38042 Grenoble, France
Аффилиация Huant, S; Institut Néel, CNRS and Université Joseph Fourier, BP 166, F-38042 Grenoble, France
Выпуск 26

Скрыть метаданые