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Автор Doh, Yong-Joo
Автор Yi, Gyu-Chul
Дата выпуска 2010-03-12
dc.description We report on the electrical characteristics of few-layer graphene (FLG) field-effect devices with their various thicknesses. In combination with a ferroelectric polymer layer of poly(vinylidene fluoride/trifluoroethylene) [P(VDF/TrFE)], FLG/ferroelectric devices exhibited nonvolatile resistance changes due to a polarization switching of the P(VDF/TrFE) layer. The bistability and retention properties were highly sensitive to the FLG thickness, which is attributed to a charge screening effect in FLG films.
Формат application.pdf
Издатель Institute of Physics Publishing
Копирайт IOP Publishing Ltd
Название Nonvolatile memory devices based on few-layer graphene films
Тип paper
DOI 10.1088/0957-4484/21/10/105204
Electronic ISSN 1361-6528
Print ISSN 0957-4484
Журнал Nanotechnology
Том 21
Первая страница 105204
Последняя страница 105208
Аффилиация Doh, Yong-Joo; Department of Display and Semiconductor Physics, Sejong Campus, Korea University, Chungnam-Do 339-800, Republic of Korea ; Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea
Аффилиация Yi, Gyu-Chul; Department of Physics and Astronomy and National Creative Research Initiative Center for Semiconductor Nanorods, Seoul National University, Seoul 151-747, Republic of Korea ;
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