Автор |
Doh, Yong-Joo |
Автор |
Yi, Gyu-Chul |
Дата выпуска |
2010-03-12 |
dc.description |
We report on the electrical characteristics of few-layer graphene (FLG) field-effect devices with their various thicknesses. In combination with a ferroelectric polymer layer of poly(vinylidene fluoride/trifluoroethylene) [P(VDF/TrFE)], FLG/ferroelectric devices exhibited nonvolatile resistance changes due to a polarization switching of the P(VDF/TrFE) layer. The bistability and retention properties were highly sensitive to the FLG thickness, which is attributed to a charge screening effect in FLG films. |
Формат |
application.pdf |
Издатель |
Institute of Physics Publishing |
Копирайт |
IOP Publishing Ltd |
Название |
Nonvolatile memory devices based on few-layer graphene films |
Тип |
paper |
DOI |
10.1088/0957-4484/21/10/105204 |
Electronic ISSN |
1361-6528 |
Print ISSN |
0957-4484 |
Журнал |
Nanotechnology |
Том |
21 |
Первая страница |
105204 |
Последняя страница |
105208 |
Аффилиация |
Doh, Yong-Joo; Department of Display and Semiconductor Physics, Sejong Campus, Korea University, Chungnam-Do 339-800, Republic of Korea ; Department of Physics, Pohang University of Science and Technology, Pohang 790-784, Republic of Korea |
Аффилиация |
Yi, Gyu-Chul; Department of Physics and Astronomy and National Creative Research Initiative Center for Semiconductor Nanorods, Seoul National University, Seoul 151-747, Republic of Korea ; |
Выпуск |
10 |